Enhancement mode III-nitride FET

Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor

Reexamination Certificate

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Details

C257S012000, C257S039000, C257S155000, C257S190000, C257S192000, C257S195000

Reexamination Certificate

active

07382001

ABSTRACT:
A III-nitride switch includes a recessed gate contact to produce a nominally off, or an enhancement mode, device. By providing a recessed gate contact, a conduction channel formed at the interface of two III-nitride materials is interrupted when the gate electrode is inactive to prevent current flow in the device. The gate electrode can be a schottky contact or an insulated metal contact. Two gate electrodes can be provided to form a bi-directional switch with nominally off characteristics. The recesses formed with the gate electrode can have sloped sides. The gate electrodes can be formed in a number of geometries in conjunction with current carrying electrodes of the device.

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Office Action issued in the corresponding Korean application dated Jul. 6, 2007.
“AIGaN/GaN Metal Oxide Semiconductor Heterostructure Field Effect Transistor” —M. Asif Khan, X. Hu, G. Sumin, A. Luney, J. Yang, R. Gaska, M.S. Shur Feb. 2, 2000.

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