Enhanced resolution matrix-laser desorption and ionization TOF-M

Details Enhanced resolution matrix-laser desorption and ionization TOF-M Enhanced resolution matrix-laser desorption and ionization TOF-M

1997-05-09

2000-06-06

Le, Hoa T.

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428336, B32B 516

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06071610&

ABSTRACT:
A thin layer for sample analysis by matrix-assisted laser desorption mass spectrometry, comprising a matrix material in a supported dispersion wherein the support is a solid or is formed from a solid. The invention is also directed to a method of making a thin layer for sample analysis by matrix-assisted laser desorption mass spectrometry, the layer comprising a matrix-solid composition disposed upon a substrate, comprising the step of depositing a solution containing matrix, solid and solvent upon a spinning substrate at a deposition rate sufficient to allow evaporation of the solvent, thereby interspersing the matrix and support on the substrate in a thin layer. Enhanced mass resolution is described.

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