Engineered lighting system for TDI inspection comprising means f

Details Engineered lighting system for TDI inspection comprising means f Engineered lighting system for TDI inspection comprising means f

1991-02-20

1992-12-15

Nelms, David C.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

356430, 358101, G01N 2186, H04N 718

Patent

active

051720051

ABSTRACT:
An engineered lighting system for high speed video inspection includes an array of light emitting diodes including light emitting diodes for use in time delay integration (TDI) inspection of web materials. The light emitting diodes of the array are selectively controllable to accomplish sequential illumination and carefully controllable imaging of a specified section of a continuously moving specimen or specimens. The system also includes an array of optional backlighting elements to aid in illumination of semi-opaque specimens to accomplish inspection thereof.

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