Energy filter and electron microscope equipped with the energy f

Details Energy filter and electron microscope equipped with the energy f Energy filter and electron microscope equipped with the energy f

1998-08-25

2000-11-21

Nguyen, Kiet T.

Radiant energy

Electron energy analysis

250311, 250396ML, H01J 4946

Patent

active

061506575

ABSTRACT:
An energy filter has a plurality of deflection means and is constructed by using the plural deflection means so that an average track of an electron beam is symmetric and the normal line to a symmetric plane is inclined against an incident direction of the electron beam.

REFERENCES:
patent: 5449914 (1995-09-01), Rose et al.
patent: 5811801 (1998-09-01), Tsuno
patent: 5952656 (1999-04-01), Kaneyama
patent: 5955732 (1999-09-01), Tsuno
F.R. Egerton: Electron Energy-Loss Spectroscopy in the Electron Microscope, Plenum Press (1986), pp. 1-25.
Ludwig Reimer Ed.: Energy-Filtering Transmission Electron Microscopy, Springer (1995), pp. 1-42.
J.C.H. Spence and J.M. Zuo: Electron Microdiffraction, Plenum Press (1992), pp. 213-244.
O.L. Krivanek, A.J. Gubbens and N. Dellby: Microsc. Microanal. Microstruct. 2(1991), pp. 315-332.
N. Ajika, H. Hashimoto, K. Yamaguchi and H. Endoh: Japanese Journal of Applied Physics, 24 (1985), pp. L41-L44.
Computer Program "Trio" for Third Order Calculation of Ion Trajectory by Akekiyo Matsuo et al.: Mass Spectroscopy, vol. 24 No. 1, Mar. 1976, pp. 19-62.

Affiliated with

Also associated with

Rating

Energy filter and electron microscope equipped with the energy f does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Energy filter and electron microscope equipped with the energy f, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Energy filter and electron microscope equipped with the energy f will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1259666