Endurance testing system for an EEPROM

Details Endurance testing system for an EEPROM Endurance testing system for an EEPROM

1998-04-06

1999-05-04

Le, Vu A.

Static information storage and retrieval

Floating gate

Particular connection

365201, G01C 700

Patent

active

059010827

ABSTRACT:
An endurance testing system for an EEPROM mainly includes a microprocessor, an interface circuit, a high power pulse generator and a write/erase control and VT test circuit for automatically performing erase/write operations as many times as desired and displaying the variation of the difference between the threshold voltages respectively after the erase and the write operations so that the endurance of the EEPROM can be efficiently and correctly tested.

REFERENCES:
patent: 5200959 (1993-04-01), Gross et al.

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