Endurance testing system and method

Details Endurance testing system and method Endurance testing system and method

2011-04-19

2011-04-19

Nguyen, Vinh P (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S537000

Reexamination Certificate

active

07928745

ABSTRACT:
An endurance testing system is configured to test endurance of a first detecting apparatus. The endurance testing system includes a second detecting apparatus, a movement module, a processor, and a storage module. The movement module includes a first inductive object and a second inductive object. The processor is connected to the first and second detecting apparatuses, and the movement module, for controlling the movement module and counting a first number of times the first detecting apparatus detects the first inductive object, and a second number of times the second detecting apparatus detects the second inductive object. The storage module is connected to the processor, for storing the first and second numbers of times from the processor. The first detecting apparatus fails the testing upon the condition that the first number of times is not equal to the second number of times.

REFERENCES:
patent: 5261285 (1993-11-01), Tokoyama
patent: 5627463 (1997-05-01), Lin
patent: 6874350 (2005-04-01), Seo et al.
patent: 2004/0000999 (2004-01-01), Turner et al.

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