End of life prediction of flash memory

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Reexamination Certificate

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07356442

ABSTRACT:
Disclosed are a method, electronic device, and computer readable medium for determining an end-of-life stage of the flash memory. The method includes detecting at least one life cycle event associated with a flash memory residing on an electronic device. A counter that is associated with the life cycle event is then incremented. Based on the counter, a total number of occurrences for the one life cycle event is determined. The total number of occurrences for the at least one given threshold is also determined. A current life cycle stage of the flash memory is identified based at least in part on determining if the total number of occurrences exceeds at least one given threshold. The life cycle stage is associated with the at least one given threshold. A user is then notified of the life cycle state of the flash memory.

REFERENCES:
patent: 5568439 (1996-10-01), Harari
patent: 6249838 (2001-06-01), Kon
patent: 2004/0218440 (2004-11-01), Kumar et al.
patent: 2005/0041453 (2005-02-01), Brazis et al.
patent: 2005/0044454 (2005-02-01), Moshayedi
patent: 2005/0108491 (2005-05-01), Wong et al.
patent: 2005/0286336 (2005-12-01), Harari et al.

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