Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate
2005-10-25
2005-10-25
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
Position or displacement
Position transverse to viewing axis
C356S401000
Reexamination Certificate
active
06958819
ABSTRACT:
An encoder uses an alignment target that includes periodic patterns on the movable element and the stationary element. The alignment target may include at least two measurement locations, each location having a different offset between the periodic pattern on the movable element with respect to the periodic pattern on the stationary element. Alternatively, two measurements using different polarization states may be made at one location. When the periodic patterns on the movable element and the stationary element are aligned, the difference between the two measurements will produce a minimum, i.e., approximately a zero value plus noise. By counting the minima, the precise position of the movable element with respect to the stationary element can be determined. The resolution of the encoder may be further increased using reference measurements.
REFERENCES:
patent: 5214492 (1993-05-01), LoBianco et al.
patent: 5216257 (1993-06-01), Brueck et al.
patent: 5307152 (1994-04-01), Boehnlein et al.
patent: 5559601 (1996-09-01), Gallatin et al.
patent: 5596413 (1997-01-01), Stanton et al.
patent: 5805290 (1998-09-01), Ausschnitt et al.
patent: 5808742 (1998-09-01), Everett et al.
patent: 5969819 (1999-10-01), Wang
patent: 6077756 (2000-06-01), Lin et al.
patent: 6079256 (2000-06-01), Bareket
patent: 6084712 (2000-07-01), Harding
patent: 6130750 (2000-10-01), Ausschnitt et al.
patent: 6313460 (2001-11-01), Haas et al.
patent: 6350984 (2002-02-01), Senda
patent: 6407396 (2002-06-01), Mih et al.
patent: 6429930 (2002-08-01), Littau et al.
patent: 6458605 (2002-10-01), Stirton
patent: 6699624 (2004-03-01), Niu et al.
patent: 6710876 (2004-03-01), Nikoonahad et al.
patent: 2002/0135875 (2002-09-01), Niu et al.
patent: 2002/0158193 (2002-10-01), Sezginer et al.
patent: 2003/0002043 (2003-01-01), Abdulhalim et al.
patent: 2003/0042579 (2003-03-01), Schulz
patent: 2003/0043372 (2003-03-01), Schulz
patent: 2003/0043375 (2003-03-01), Opsal
patent: 2003/0044702 (2003-03-01), Schulz
patent: 2003/0160163 (2003-08-01), Wong et al.
patent: 2003/0169423 (2003-09-01), Finarov et al.
patent: 2003/0212525 (2003-11-01), Bischoff et al.
patent: 2003/0223630 (2003-12-01), Adel et al.
patent: 2004/0101983 (2004-05-01), Jones et al.
patent: WO 01/84382 (2001-11-01), None
patent: WO 02/25723 (2002-03-01), None
patent: WO 02/065545 (2002-08-01), None
patent: WO 02/069390 (2002-09-01), None
patent: WO 02/084213 (2002-10-01), None
patent: WO 03/071471 (2003-08-01), None
patent: WO 2004/008068 (2004-01-01), None
D.C. Flanders & Henry I. Smith, A new interferometric alignment techniquea), Applied Physics Letters, vol. 31, No. 7, Oct. 1, 1977, pp. 426-428.
Bischoff, J. et al., “Light Diffraction Based Overlay Measurement”Proceedings of SPIE, vol. 4344 (2001) pp. 222-233.
Michaelis, A. et al., “Spectroscopic Anistropy Micro-Ellipsometry (SAME) for determiation of lateral and vertical dimensions of sub-micron lithographic structures” IEEE Catalog Number 99TH8453 (1999) pp. 131-134.
NanoWave:Technology/development tools, http://www.nanowave.com/technology—applications/tech—devtoolsPR.html, 2 pages, downloaded Apr. 9, 2002.
NanoWave:Technology/how it works, http://www.nanowave.com/technology—applications/tech—HIWPR.html, 3 pages, downloaded Apr. 9, 2002.
NanoWave:Technology/product design, http://www.nanowave.com/technology—applications/tech—designPR.html, 4 pages, downloaded Apr. 9, 2002.
Heaton John D.
Lowe-Webb Roger R.
Yang Weidong
Nanometrics Incorporated
Pham Hoa Q.
Silicon Valley Patent & Group LLP
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