Encoder signal analysis system for high-resolution position meas

Coded data generation or conversion – Phase or time of phase change – Synchro or resolver signal

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

341155, H03M 522

Patent

active

059331062

ABSTRACT:
A signal analysis system for processing quadrature analog waveforms from an encoder. High-resolution position measurements for external measurement devices are obtained. A hardware component receives the quadrature analog signals from the encoder and processes these signals to generate low and high-resolution waveforms. These waveforms are then further processed and sent as first and second data streams to a computational component of the signal analysis system. The absolute phase angle (.THETA.) of the encoder's analog signal is determined by processing the data streams with the computational component. .THETA. is compared to a series of calibration factors to determine the position of the translating component of the external measurement device.

REFERENCES:
patent: 5365184 (1994-11-01), Callender et al.
patent: 5442172 (1995-08-01), Chiang et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Encoder signal analysis system for high-resolution position meas does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Encoder signal analysis system for high-resolution position meas, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Encoder signal analysis system for high-resolution position meas will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-853429

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.