En-face functional imaging using multiple wavelengths

Details En-face functional imaging using multiple wavelengths En-face functional imaging using multiple wavelengths

2007-05-29

2007-05-29

Lee, Hwa (Andrew) (Department: 2877)

Optics: measuring and testing

By light interference

For dimensional measurement

Reexamination Certificate

active

10690046

ABSTRACT:
Methods and apparatus for en-face imaging using multiple wavelengths are described. In general, an imaging system receives light reflected from a sample under test and distinguishes between reflected light at a first wavelength and reflected light at a second wavelength. Images at both wavelengths are collected simultaneously. En-face images are output using en-face image data corresponding to the first wavelength and en-face image data corresponding to the second wavelength.

REFERENCES:
patent: 4806776 (1989-02-01), Kley
patent: 5450205 (1995-09-01), Sawin et al.
patent: 6485413 (2002-11-01), Boppart et al.
patent: 6611339 (2003-08-01), Yang et al.
patent: 6847454 (2005-01-01), Crowley et al.
patent: 2003/0137669 (2003-07-01), Rollins et al.
patent: WO 97/32182 (1997-02-01), None

Affiliated with

Also associated with

Rating

En-face functional imaging using multiple wavelengths does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with En-face functional imaging using multiple wavelengths, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and En-face functional imaging using multiple wavelengths will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3721863