Radiant energy – With charged particle beam deflection or focussing – With detector
Patent
1990-07-05
1992-06-09
Howell, Janice A.
Radiant energy
With charged particle beam deflection or focussing
With detector
25036301, H05H 700, G01T 120
Patent
active
051209683
ABSTRACT:
The invention is a device to measure the emittance of a charged particle beam. The device is capable of providing precise time resolution limited only by the chosen detector. The device allows a complete emittance determination as a function of time. The preferred embodiment of the invention comprises a plurality of thin foils 11 which generate an optical transistion radiation (OTR) pattern 13; a lens system 14 to collect the OTR pattern 13 from the said foils 11: an optical mask 16 to allow passage of the OTR pattern 13 :and a detector array 17 or similar device placed behind the mask 16 which intercepts, senses and measures the point source OTR pattern 13 for each perforation in the mask.
REFERENCES:
patent: 3180986 (1965-04-01), Grigson
patent: 3207982 (1965-09-01), Rose
patent: 3293429 (1966-12-01), Leboutet et al.
patent: 3600580 (1971-08-01), Vogel
patent: 3749926 (1973-07-01), Lee
patent: 3937957 (1976-02-01), Schillalies et al.
patent: 3942012 (1976-03-01), Boux
patent: 4455532 (1984-06-01), Gregory et al.
patent: 4584474 (1986-04-01), Franchy et al.
patent: 4727250 (1988-02-01), Henzler
patent: 4731538 (1988-05-01), Gray
Lumpkin et al., "OTR Measurements for Los Alamos Free-Electron Laser Expeents", Nuclear Instr. & Methods, Sec. A vol. A285, No. 1-2, pp. 343-348.
Iversen et al., "Change Particle Beam Divergence Measurements Using OTR" Proceed. of the 1987 IEEE Particle Accelerator (Cat. No. 87CH2387-9) Pub. IEEE, N.Y., pp. 573-575, vol. 1.
Wartski et al., "Interference Phenomenon in OTR & Its Applic. to Particle Beams", J. Appl. Phys. 46(8), 3644-3653 (Aug. 75).
Fiorito Ralph B.
Rule Donald W.
Hanig Richard
Howell Janice A.
Lewis John D.
The United States of America as represented by the Secretary of
Walden Kenneth E.
LandOfFree
Emittance measuring device for charged particle beams does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Emittance measuring device for charged particle beams, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Emittance measuring device for charged particle beams will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1806359