Emissivity measurement apparatus and method

Details Emissivity measurement apparatus and method Emissivity measurement apparatus and method

1994-01-21

1996-04-09

Gutierrez, Diego F. F.

Thermal measuring and testing

Emissivity determination

374129, G01N 2500, G01J 500, G01J 552

Patent

active

055055435

ABSTRACT:
Method and apparatus for measuring thermal radiation emitted by a sample, and for determining emissivity. The apparatus comprises a chamber in which the sample may be positioned, the chamber comprising a plurality of walls including a first wall containing an observation port. The chamber is located in a cold environment, and the walls of the chamber are brought to a selected temperature by circulating a temperature conditioned fluid through the walls. The sample is moved along a movement axis within the chamber past the observation port. As the sample is so moved, radiation emitted outwards through the observation port by the sample is measured.

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patent: 4433924 (1984-02-01), Quinn, III
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patent: 4881823 (1989-11-01), Tanaka et al.
patent: 4984902 (1991-01-01), Crowley et al.
patent: 5186541 (1993-02-01), Paulk
patent: 5308161 (1994-05-01), Stein

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