Emissivity error correcting method for radiation thermometer

Details Emissivity error correcting method for radiation thermometer Emissivity error correcting method for radiation thermometer

1986-04-07

1987-04-21

Frankfort, Charles

Thermal measuring and testing

Temperature measurement

In spaced noncontact relationship to specimen

374126, 374127, 250339, 250340, G01J 500

Patent

active

046592342

ABSTRACT:
A method of more accurately measuring the true surface temperature of metal alloy objects without contacting the same. The surfaces of the objects have unknown emissivities that change and that are less than unity. The method includes the step of providing objects having surfaces that radiate infrared energy. The radiated energy is measured at two wavelengths, and a first measurement is provided that is a function of the ratio of the energies at the two wavelengths. The radiated energy is also measured at a single, narrow band wavelength, and a second measurement is provided that is a function of the radiated energy. The two measurements are then electrically combined to provide measurements of radiated energy and thus temperature measurements that are or at least are closer to the true temperature than either of the first or second measurements.

REFERENCES:
patent: 2237713 (1941-04-01), Russell
patent: 3922550 (1975-11-01), Crowley et al.
patent: 4561786 (1985-12-01), Anderson
European patent application to Rudolf, No. 0119724, published Sep. 1984, now U.S. Pat. No. 4,579,461.

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