Emission spectroscopic analyzer

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

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356313, G01N 2173, G01J 3443

Patent

active

047892390

ABSTRACT:
Radioactive materials can be safely analyzed by an emission spectroscopic analyzer comprising an exciting device for exciting a radioactive material to be analyzed to emit light. The exciting device is enclosed in a radiation shielding wall. A detecting device detects the emitted light. The detecting device is located outside the radiation shielding wall. A light-transmitting device is provided between the exciting device and the detecting device such that the emitted light impinging on a first end of the light-transmitting device will be received at the detecting device as light having been transmitted through the light-transmitting device and emitted from a second end of the light-transmitting device. The light-transmitting device penetrates a hole made in the radiation shielding wall which has a sealing structure to prevent radiation leakage. The light-transmitting device penetrates the hole with a curvature. A lens system is attached to the second end of the light-transmitting device to permit visual observation of the emitted light therethrough. A fine adjustment device adjusts the position of the first end of the light-transmitting device in relation to the emitted light from the material to be analyzed.

REFERENCES:
patent: 2484003 (1949-10-01), Simison
patent: 3004368 (1961-10-01), Hicks, Jr.
patent: 3216807 (1965-11-01), Woodcock
patent: 3279460 (1966-10-01), Sheldon
patent: 3504060 (1970-03-01), Gardner
patent: 3692415 (1972-09-01), Shiller
patent: 3723007 (1973-03-01), Leonard
patent: 3758188 (1973-09-01), Koester
patent: 3819442 (1974-06-01), Brushenko
patent: 3909133 (1975-09-01), Hobson et al.
patent: 3942892 (1976-03-01), Ambrose et al.
patent: 4076377 (1978-02-01), Moraschetti
patent: 4113350 (1978-09-01), Haines
patent: 4256404 (1981-03-01), Walker
patent: 4326802 (1982-04-01), Smith, Jr. et al.
patent: 4375919 (1983-03-01), Busch
patent: 4378952 (1983-04-01), Siegmund
patent: 4395005 (1983-07-01), Ganssle
patent: 4432644 (1984-02-01), Demers et al.
patent: 4452623 (1984-06-01), Utsumi et al.
patent: 4470699 (1984-09-01), Gay
patent: 4623250 (1986-11-01), Onishi et al.
Adrain et al., Laser & Elektro-Optik, vol. 12, No. 3, pp. 5-9, Sep. 1980.
"Improvement in the Analyses of Metal", Anon, Industrial Opportunities Ltd. Research Disclosure, No. 124, p. 12, Aug. 1974.

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