EMI test system and decoupling network therefor, the decoupling

Details EMI test system and decoupling network therefor, the decoupling EMI test system and decoupling network therefor, the decoupling

1994-09-19

1996-07-30

Wieder, Kenneth A.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

324627, G01R 2728

Patent

active

055415210

ABSTRACT:
Development of worst case operating environment, interfering parameters of a test item, is effected by a decoupling device. The device includes a series of resonators configured and interconnected in a particular manner along with a shunt capacitance. Each resonator has a torroidal core formed from a ferrite composition. When connected between the test item and its support system, the device provides such an impedance to signals other than those needed for normal operation, that the highest noise voltage levels emit from the test item. These levels permit developing repeatable worst case interference parameters which provide a guide for modifying the test item circuit components and connectors so as to minimize the effects of generating EMI sources or to immunize susceptible receptors within the test item.

REFERENCES:
patent: 4763062 (1988-08-01), Trzcinski et al.
Paper entitled "An Electromagnetic Immunity Diagnostic Tool For Electronic Circuits" presented at The 1991 International Symposium on Electromagnetic Compatibility. Authors: James P. Muccioli and Terry M. North.

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