Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-05-24
2005-05-24
Pert, Evan (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
06897666
ABSTRACT:
A method and apparatus for making a probe head that has reduced voltage droop and improved transient response. One embodiment a cable providing a plurality of signal conductors and a plurality of power conductors including a first power conductor and a second power conductor, a probe head wired to the cable, a plurality of electrical contacts including a first electrical contact and a second electrical contact, wherein each one of the plurality of electrical contacts is fixed to the probe head and wherein the first power conductor is connected to the first electrical contact, and a first regulatory device physically residing in the probe head and wired between the second power conductor and the first electrical contact. In some embodiments, the first regulatory device includes an active transient control device that senses an output voltage and sources or sinks an appropriate supplemental amount of current to improve transient response.
REFERENCES:
patent: 5600257 (1997-02-01), Leas et al.
patent: 6480012 (2002-11-01), Komori
Ding Jun
Pan Jin
Swettlen Tim
Zhu Hua
Nguyen Tung X.
Pert Evan
Primarion, Inc.
Schwegman Lundberg Woessner & Kluth P.A.
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