Embedded phase noise measurement system

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Phase shift by less than period of input

Reexamination Certificate

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C327S244000

Reexamination Certificate

active

07952408

ABSTRACT:
Phase noise detection systems for a device under test (DUT) are provided that can be embedded within a chip. According to one embodiment, the embedded phase noise detection system can include an active delay line cell, a phase shifter, and a phase detector. The active delay line and phase shifter separately receive the output signal of the DUT. The phase detector can include a double-balanced mixer followed by an active RC filter. The double-balanced mixer receives, as input, the outputs from the active delay line and phase shifter and can produce different dc voltages proportional to the difference from the input phase quadrature. An auto-adjustment circuit can also be included to help the input signal from the phase shifter to the mixer maintain quadrature.

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