Excavating
Patent
1981-10-30
1984-11-06
Atkinson, Charles E.
Excavating
324 73R, 371 20, 371 25, G01R 3128
Patent
active
044816278
ABSTRACT:
A method for testing memory arrays embedded within electronic assemblies having other combinatorial logic elements connected to the inputs thereof. By following stated design rules, the embedded memory can be isolated from the combinatorial logic element and tested by use of a memory test subsystem either before or after the combinatorial logic elements are tested by a logic test subsystem. Both logic and memory tests are performed by a process that requires but a single handling of the electronic assemblies.
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Bohner et al., Module-in-Place Testing Isolation Technique Using Shift Registers, IBM Tech. Discl. Bulletin, vol. 23, No. 9, Feb. 1981, pp. 4080-4082.
Jackson et al., Module-in-Place Testing Autoguided Probe Isolation and Diagnostic Technique, vol. 23, No. 9, Feb. 1981, IBM Tech. Discl. Bulletin, pp. 4078-4079.
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Beauchesne Robert C.
Russell Robert J.
Atkinson Charles E.
Honeywell Information Systems Inc.
Linnell William A.
Prasinos Nicholas
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