Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2005-04-22
2009-10-06
Strege, John B (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S187000, C382S188000, C382S190000, C382S289000, C382S291000
Reexamination Certificate
active
07599560
ABSTRACT:
In accordance with embodiments of the invention, embedded interaction code (EIC) symbols are recognized. EIC dots are generated based on effective EIC symbols, which have been generated by processing an image containing the EIC symbols, by obtaining graylevels of selected positions of the EIC-symbols. Rotated EIC dots are generated based on the EIC dots by determining which grid cells correspond to the EIC symbols and by determining which direction is a correct orientation of the EIC symbols. A homography matrix is updated with orientation information based on the EIC dots. EIC bits are extracted from the rotated EIC dots based on graylevels of selected positions of the rotated EIC dots.
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Chen Liyong
Dang Yingong
Wang Jian
Wang Qiang
Wu Jiang
Microsoft Corporation
Perkins Coie LLP
Strege John B
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