Embedded integrated circuit aging sensor system

Details Embedded integrated circuit aging sensor system Embedded integrated circuit aging sensor system

2006-05-30

2006-05-30

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C438S017000

Reexamination Certificate

active

07054787

ABSTRACT:
A method and apparatus for sensing an aging effect on an integrated circuit using a sensor disposed on the integrated circuit and arranged to generate an output dependent on a condition of an element within the sensor. A processor operatively connected to the sensor is arranged to indicate a code dependent the output.

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