Embedded IC test circuits and methods

Details Embedded IC test circuits and methods Embedded IC test circuits and methods

2008-05-27

2008-05-27

Jackson, Blane J. (Department: 2618)

Telecommunications

Transmitter

With feedback of modulated output signal

C455S127200, C455S115100

Reexamination Certificate

active

07379716

ABSTRACT:
A self-testing transceiver having an on-chip power detection capability is provided. The self-testing transceiver can include a semiconductor substrate and a transmitter having a high-power amplifier disposed on the substrate. The self-testing transceiver also can include a receiver disposed on the substrate for selectively coupling to an antenna. The self-testing transceiver can further include at least one power detector disposed on the semiconductor substrate for determining a power such as an RMS and/or peak-power of a signal at an internal node of the self-testing transceiver. Additionally, the self-testing transceiver can include a loopback circuit disposed on the substrate.

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