Embedded fuse resistance measuring circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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Details

327525, 324713, G01R 3102, H01H 3776

Patent

active

054536960

ABSTRACT:
The present invention provides for an embedded test circuit in an integrated circuit. The integrated circuit has a plurality of conducting line segments and fuse elements therebetween with each fuse element selectively connectable in series through the crossing line segments and programming circuits between a pair of programming terminals. Each fuse element is also associated with a pair of test lines with each test line connected to one of the line segments having the fuse element between the test lines. Each test line pair is selectively connectable to a pair of test terminals. The resistance of a selected fuse element is measured by selectively passing a current between the first and second programming terminals through the selected fuse element and selectively measuring a voltage drop across the selected fuse element through the pair of test terminals.

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patent: 5243226 (1993-09-01), Chan
patent: 5272388 (1993-12-01), Bakker
patent: 5293133 (1994-03-01), Birkner et al.
patent: 5294846 (1994-03-01), Paivinen
patent: 5299150 (1994-03-01), Galbraith et al.
patent: 5302546 (1994-04-01), Gordon et al.
patent: 5304871 (1994-04-01), Dharmarajan

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