Elimination of mask undercutting in the fabrication of InP/InGaA

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29576E, 29578, 29580, 148171, 148175, 148DIG50, 148DIG72, 148DIG118, 156649, 156652, 156656, 1566591, 357 17, 357 56, 372 46, 427 39, 427 93, 427 95, H01L 2120, H01L 21302

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045661715

ABSTRACT:
In the fabrication of buried heterostructure InP/InGaAsP lasers, mask undercutting during the mesa etching step is alleviated by a combination of steps which includes the epitaxial growth of a large bandgap InGaAsP cap layer (1.05 eV.ltorsim.E.sub.g .ltorsim.1.24 eV) and the plasma deposition of a SiO.sub.2 etch masking layer. Alternatively, the cap layer may be a bilayer: an InGaAs layer or narrow bandgap InGaAsP (E.sub.g .ltorsim.1.05 eV), which has low contact resistance, and a thin InP protective layer which reduces undercutting and which is removed after LPE regrowth is complete. In both cases, etching at a low temperature with agitation has been found advantageous.

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