Eliminating phase shift in an integrated circuit tester

Details Eliminating phase shift in an integrated circuit tester Eliminating phase shift in an integrated circuit tester

1998-02-25

1999-12-28

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 7652, 324 7674, 324 7679, G01R 2504, G01R 3126

Patent

active

060086637

ABSTRACT:
An integrated circuit (IC) testing apparatus automatically detects and eliminates a phase difference between signals. A signal selection circuit 30 selects two test signals from a test pattern applied to a test device and outputs two test signals as a standard signal and comparison signal. A phase difference extraction circuit 40 extracts a phase difference between the standard signal and the comparison signal, while a mask circuit 50 generates a mask to eliminate unnecessary portions of the phase difference. A phase difference detection circuit 60 detects whether a phase difference exists and instructs whether to proceed with the counting of a counter circuit 90. A phase fail detection circuit 70 detects whether the phase of the comparison signal progresses ahead of the standard signal, and then outputs a fail signal. If a fail signal is not outputted, the counter circuit 90 determines the amount of delay of a programmable delay circuit 20 which then delays the comparison signal.

REFERENCES:
patent: 5006794 (1991-04-01), Gal et al.
patent: 5231598 (1993-07-01), Vlahos
patent: 5646519 (1997-07-01), Hamilton et al.
patent: 5894226 (1999-04-01), Koyama

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