Elevation sampling terrain probe

Details Elevation sampling terrain probe Elevation sampling terrain probe

1978-04-24

1979-06-19

Haroian, Harry N.

Geometrical instruments

Area integrators

Electrical

G01B 734, G01B 728

Patent

active

041582586

ABSTRACT:
A surface contour sampling system is disclosed which intermittently measu the elevational irregularities in various and sundry surfaces, including those of the earth's terrain, model boards, and the like, with respect to a predetermined datum plane. A unique rotating bell crank and stepping surface sensing sampler combination permits the stepping upon and/or over large sloping or elevational changes by said surface sensing sampler, including those that are normal to the surface trend at any given location, without being stopped thereby, as it is moved forward along a predetermined path thereon by a suitable carrier vehicle.

REFERENCES:
patent: 3056209 (1962-10-01), Oliver
patent: 3470739 (1969-10-01), Takafuji et al.

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