Elementary analysis device by optical emission spectrometry...

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

Reexamination Certificate

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C356S326000, C359S739000

Reexamination Certificate

active

07106439

ABSTRACT:
This device comprises a pulsed laser source (6), means (8, 10, 12) for focusing light from this source onto an object to be analysed (2) to produce plasma on the surface of the object, means (16, 18) of analyzing a plasma radiation spectrum, means (20) of determining the elementary composition of the object from this analysis, and possibly means (4) for displacing the object. The invention is particularly applicable to test radioactive materials.

REFERENCES:
patent: 3783874 (1974-01-01), Koester et al.
patent: 4407964 (1983-10-01), Elings et al.
patent: 4758533 (1988-07-01), Magee et al.
patent: 4786813 (1988-11-01), Svanberg et al.
patent: 5537207 (1996-07-01), Carlhoff et al.
patent: 5583634 (1996-12-01), Andre et al.
patent: 5657304 (1997-08-01), Lehureau
patent: 5751416 (1998-05-01), Singh et al.
patent: 5780806 (1998-07-01), Ferguson et al.
patent: 5781289 (1998-07-01), Sabsabi et al.
patent: WO 01/33202 (2001-05-01), None
F. L. Pedrotti, S. J. Pedrotti, ‘Introduction to Optics’, Prentice Hall, New Jersey, 1993, pp. 40-57.
Cremers, et al., “Remote Elemental Analysis by Laser-Induced Breakdown Spectroscopy Using a Fiber-Optic Cable”, Jun. 1995, 1369 Applied Spectroscopy, vol. 49, No. 6, pp. 857-860.
Marquardt et al., “Novel Probe for Laser-Induced Breakdown Spectroscopy and Raman Measurements Using an Imaging Optical Fiber”, 1998, Applied Spectroscopy, vol. 52, No. 9, pp. 1148-1153.
“Study of Emission Spectroscopy on Laser Produced Plasma For Localised Multielemental Analysis in Solids with Surface Imaging”, Nov. 1993-Apr. 1996, 14 pages.
Berndt et al., “Mikro-Emissionsspektralanalyse mit Festkorper-LASER”, 1965, pp. 45-57.

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