Elemental analysis method and apparatus

Details Elemental analysis method and apparatus Elemental analysis method and apparatus

1996-12-27

1998-10-06

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With sample excitation

250288, G01N 2173

Patent

active

058185810

ABSTRACT:
In an elemental analysis method of analyzing a sample as an analysis target using atoms generated upon dissociation of the sample, a plasma is generated using a gas serving as a plasma source to be supplied in a torch having a conical cylinder thereof. A sample flow obtained by evaporating the sample using the gas as a carrier gas or a sample flow containing a component of the sample is supplied to the plasma. The sample flow or the plasma containing the sample flow is changed into a spiral flow, and the component of the sample is dissociated. The sample is analyzed in accordance with the state of an atom generated by dissociation of the component of the sample. An elemental analysis apparatus is also disclosed.

REFERENCES:
patent: 4266113 (1981-05-01), Denton et al.
patent: 4551609 (1985-11-01), Falk
patent: 4721126 (1988-01-01), Horii
patent: 4818916 (1989-04-01), Morrisroe
J.C. Eames et al., "Practical Design for an ICP Demountable Plasma Torch", 1369 Applied Spectroscopy 46 (1992), N. 11, pp. 1745-1746.
Thomas R. Smith et al., "A High-Pressure Inductively Coupled Plasma Torch", 1369 Applied Spectroscopy 41 (1987) May/Jun., No. 4, pp. 654-657.

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