Element substrate, test method for element substrate, and...

Details Element substrate, test method for element substrate, and... Element substrate, test method for element substrate, and...

2008-04-29

2008-04-29

Mis, David (Department: 2817)

Oscillators

With frequency calibration or testing

C438S018000

Reexamination Certificate

active

07365611

ABSTRACT:
A test circuit and a test method using a plurality of oscillation circuits for evaluation are provided in order to reduce the measuring time and simplify the test. One measuring terminal is shared by a plurality of oscillation circuits for evaluation that are formed over the same substrate as a semiconductor device such as a display device, and the plurality of oscillation circuits for evaluation can be tested by the measuring output terminal. Then, the measurement results are Fourier transformed to obtain the oscillation frequency of the plurality of oscillation circuits for evaluation at the same time. Thus, variations in semiconductor elements can be evaluated.

REFERENCES:
patent: 6887724 (2005-05-01), Nakamura et al.
patent: 7291507 (2007-11-01), Bidermann et al.
patent: 2004/0101989 (2004-05-01), Honda
patent: 2005/0017239 (2005-01-01), Nakamura et al.
patent: 2005/0024079 (2005-02-01), Honda et al.
patent: 2005/0196883 (2005-09-01), Asano et al.
patent: 2005/0273290 (2005-12-01), Asano et al.

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