Element analyzing method

Details Element analyzing method Element analyzing method

1993-12-03

1995-07-04

Dzierzynski, Paul M.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

364498, G01N 23223

Patent

active

054307864

ABSTRACT:
Element identification and concentration calculation can be conducted with precision by correcting waveform distortion caused by the energy resolution of a detection system. A smoothing process is effected on a measured waveform of fluorescent X-rays obtained from an object to be measured. A device function of the detection system is obtained for each analytic element, based on the energy resolution of the detection system for a fluorescent X-ray energy value of each analytic element. A deconvolution process is effected on the measured waveform thus smoothed, by using the device functions of the detection system. Analytic elements are identified and concentrations of the analytic elements are obtained from the waveform data after the deconvolution process. The measured waveform is compensated for absorption in a beryllium window prior to smoothing.

REFERENCES:
patent: 4974209 (1990-11-01), Hoult
patent: 5249216 (1993-09-01), Ohsungi et al.
patent: 5369275 (1994-11-01), Usui et al.

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