Electrostatic ion trap mass spectrometers

Details Electrostatic ion trap mass spectrometers Electrostatic ion trap mass spectrometers

2005-05-03

2005-05-03

Berman, Jack I. (Department: 2881)

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

C250S294000, C250S281000

Reexamination Certificate

active

06888130

ABSTRACT:
An improved electrostatic ion trap mass spectrometer based on two reflectrons and Fourier Transform analysis is disclosed. An ensemble of ions with a kinetic energy falling into a certain range will do isochronous oscillations in this reflectron trap. The image charge transient of those oscillations is processed with a data acquisition system similar to those used in FT-MS to get a mass spectrum. Various application-specific ion extractors, ion storage prior to extraction, MS/MS techniques and MSntechniques are also disclosed.

REFERENCES:
patent: 3621242 (1971-11-01), Ferguson et al.
patent: 3727047 (1973-04-01), Janes
patent: 4072862 (1978-02-01), Mamyrin et al.
patent: 4507555 (1985-03-01), Chang
patent: 4731532 (1988-03-01), Frey et al.
patent: 4988879 (1991-01-01), Zare et al.
patent: 5017780 (1991-05-01), Kutscher et al.
patent: 5696375 (1997-12-01), Park et al.
patent: 5880466 (1999-03-01), Benner
patent: 5886346 (1999-03-01), Makarov
patent: 5905258 (1999-05-01), Clemmer et al.
patent: 6013913 (2000-01-01), Hanson
patent: 6020586 (2000-02-01), Dresch et al.
patent: 6040575 (2000-03-01), Whitehouse et al.
patent: 6107625 (2000-08-01), Park
patent: 6208951 (2001-03-01), Kumar et al.
patent: 20020190200 (2002-12-01), Zajfman et al.
patent: 44 08 489 (1995-09-01), None
patent: 4408489 (1995-09-01), None
Dahan et al., “A new type of electrostatic ion trap for storage of fast ion beams”, Rev. Sci. Instrum. 69 (1), Jan. 1998, pp. 76-83.*
Bateman, H. et al., “Micromass,” Proc. 48th ASMS Conference, Long Beach, California (2000).
Benner, W. H., “Analytic Chemistry,” 69 (1997) pp 4162-4168.
Bergmann et al., “Rev. Sci. Instrum.,” 61/10 (1990) p 2585.
Hanson, C.D., 47th ASMS Conference, Dallas, Texas (1999).
Makarov, HD Technologies, 47th ASMS Conference, Dallas, Texas (1999).
Park, Melvin, Brucker Daltonics Inc., 48th ASMS Conference, Long Beach, California (2000).
Park, Melvin, Brucker Daltonics Inc., 46th ASMS Conference, Orlando, Florida (1998) p 883.
Piyadasa, C.K.G. et al., “A High Resolving Power Multiple Reflection MALDI TOF,” Rapid Commun. Mass Spectrometry, 13 (1999) pp 620-624.
S. Ring, H.B. Pedersen, O. Heber, M.L. Rappaport, P.D. Witte, K.G. Bhushan, N. Altstein, Y. Rudich, I. Sagl, and D. Zajfman, “Fourier Transform Time-of-Flight Mass Spectrometry in an Electrostatic Ion Beam Trap,” Analytic Chemistry, 72 (2000), p 4041-4046.
Rockwood, A.L., J. Am. Soc. Mass Spectrometry, 10/3 (1999) p 241.
Scherer et al., “Prototype of a Reflection Time-of-Flight Mass Spectrometer for the Rosetta Rendevous Mission,” Proc. 46th ASMS Conference, Orlando, Florida (1998) p 1238.
Wollnik, H. and M. Przewloka, “Time-of-Flight Mass Spectrometers with Multiply Reflected Ion Trajectories,” International Journal of Mass Spectrometry and Ion Processes, 96 (1990), pp 287-274.
Wollnik, H. et al., 47th ASMS Conference, Dallas, Texas (1999).
Wollnik, H. et al., 48th ASMS Conference, Long Beach, California (2000).
Zajfman, D. et al., Phys. Rev.A, 55/3 (1997) p R1577.

Affiliated with

Also associated with

Rating

Electrostatic ion trap mass spectrometers does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electrostatic ion trap mass spectrometers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrostatic ion trap mass spectrometers will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3420033