Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-05-20
2008-05-20
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C361S056000
Reexamination Certificate
active
07375543
ABSTRACT:
The present invention provides a system and method for electrostatic discharge (ESD) testing. The system includes a circuit that has a switch coupled to an input/output (I/O) circuit of a device under test (DUT), a charge source coupled to the switch, and a control circuit coupled to the switch, wherein the control circuit turns on the switch to discharge an ESD current from the charge source to the I/O circuit, and wherein the circuit is integrated into the DUT. According to the system and method disclosed herein, the system provides on-chip ESD testing of a DUT without requiring expensive and specialized test equipment.
REFERENCES:
patent: 5159369 (1992-10-01), Hashimoto
patent: 5521783 (1996-05-01), Wolfe et al.
patent: 5751525 (1998-05-01), Olney
patent: 5818088 (1998-10-01), Ellis
patent: 5818235 (1998-10-01), Simonov et al.
patent: 5901022 (1999-05-01), Ker
patent: 6118323 (2000-09-01), Chaine et al.
patent: 6125021 (2000-09-01), Duvvury et al.
patent: 6323689 (2001-11-01), Morishita
patent: 6433985 (2002-08-01), Voldman et al.
patent: 6552583 (2003-04-01), Kwong
patent: 6618230 (2003-09-01), Liu et al.
patent: 6624998 (2003-09-01), May et al.
patent: 6713816 (2004-03-01), Wolf et al.
patent: 6756834 (2004-06-01), Tong et al.
patent: 6963110 (2005-11-01), Woo et al.
patent: 7009253 (2006-03-01), Rodov et al.
patent: 7212387 (2007-05-01), Duvvury et al.
patent: 2003/0071662 (2003-04-01), Kwong
patent: 2005/0029595 (2005-02-01), Rodov et al.
patent: 2005/0207078 (2005-09-01), Liao et al.
patent: 2005/0236673 (2005-10-01), Woo et al.
patent: 2006/0061929 (2006-03-01), Duvvury et al.
patent: 2006/0157703 (2006-07-01), Kodama et al.
patent: 2006/0262470 (2006-11-01), Marum et al.
patent: 2007/0007598 (2007-01-01), Woo et al.
Chen Jau-Wen
Ito Choshu
Loh William M.
Hollington Jermele
LSI Corporation
Strategic Patent Group P.C.
LandOfFree
Electrostatic discharge testing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electrostatic discharge testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrostatic discharge testing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2773946