Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-08-23
2005-08-23
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
06933741
ABSTRACT:
An equipment (400) for testing semiconductor device performance under high energy pulse conditions, which comprises a high voltage generator (401) and an on/off switch relay (403). The relay is resistively connected by a first resistor (402) to the generator and by a second resistor (404) to the socket (405a) for the device-under-test (406); the relay is operable in a partially ionized ambient. A capacitor (407) is connected to the relay, to the generator, and to the device, and is operable to discharge high energy pulses through the device. A third resistor (410) is in parallel with the capacitor and the device, and is operable to suppress spurious pulses generated by the relay. This third resistor has a value between about 1 kΩ and 1 MΩ, preferably about 10 kΩ, several orders of magnitude greater than the on-resistance of the device-under-test.
REFERENCES:
patent: 3806829 (1974-04-01), Duston et al.
patent: 5514919 (1996-05-01), Walley
Duvvury Charvaka
Kunz, Jr. John E.
Steinhoff Robert M.
Brady III W. James
Nguyen Trung Q.
Nguyen Vinh
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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