Electrostatic discharge protection device

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Device protection

Reexamination Certificate

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Details

C257S141000, C257S162000, C257S167000, C257S355000, C257S360000, C257S362000

Reexamination Certificate

active

07109533

ABSTRACT:
There is provided an electrostatic discharge protection device comprising a P conductive type first P well region101formed in a P type epitaxial layer31being deposited on a surface of a P+ substrate30having a prescribed thickness, an N conductive type first N well101a periphery thereof being brought into direct contact with and surrounded by a first P well region101, P conductive type first P diffusion regions121aand121b, a P conductive type third P diffusion region125, and an N conductive type second N diffusion region223arranged within a first P well region101, and a P conductive type second P diffusion region123and an N conductive type first N diffusion region221arranged within a first N well201.

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patent: 2001-085534 (2001-03-01), None
Mergens et al., “High Holding Current SCRs (HHI-SCR) for ESD Protection and Latch-up Immune IC Operation,”EOS/ESD Symposium, 2002, © Samoff and ESD Association.
Russ et al., “GGSCRs: GGNMOS Triggered Silicon Controlled Rectifiers for ESD Protection in Deep Sub-Micron CMOS Processes,”EOS/ESD Symposium2001, © Samoff and ESD Association.
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