Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2008-01-23
2009-08-18
DeBeradinis, Robert (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
C257S355000, C257S357000
Reexamination Certificate
active
07576961
ABSTRACT:
Provided is an electrostatic discharge (ESD) protection circuit using a silicon controlled rectifier (SCR), which is applied to a semiconductor integrated circuit (IC). A semiconductor substrate has a triple well structure such that a bias is applied to a p-well corresponding to a substrate of a ggNMOS device. Thus, a trigger voltage of the SCR is reduced. In addition, two discharge paths are formed using two SCRs including PNP and NPN bipolar transistors. As a result, the ESD protection circuit can have greater discharge capacity.
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Kim Jong Dae
Kim Kwi Dong
Kwon Chong Ki
Bauer Scott
DeBeradinis Robert
Electronics and Telecommunications Research Institute
Ladas & Parry LLP
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