Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2011-03-15
2011-03-15
Jackson, Stephen W (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
C361S111000
Reexamination Certificate
active
07907374
ABSTRACT:
An ESD prevention circuit is provided. The ESD prevention circuit comprises a voltage source, a charge-blocking unit, a first PMOS transistor, a first NMOS transistor, a second NMOS transistor, and an output unit. The charge-blocking unit is coupled to the voltage source and provides a reverse voltage to control the voltage source to remain at a zero potential when an electrostatic voltage is being generated. The first PMOS transistor is coupled to the charge-blocking unit. The first NMOS transistor is coupled to the first PMOS transistor. The second NMOS transistor is coupled to the first PMOS transistor and the first NMOS transistor. The output unit is coupled to the second NMOS transistor. The electrostatic voltage is affected by the charge-blocking unit and does not raise impendence of the turned-on second NMOS transistor.
REFERENCES:
patent: 5852541 (1998-12-01), Lin et al.
patent: 7027276 (2006-04-01), Chen
patent: 7061737 (2006-06-01), Chen
patent: 2006/0268473 (2006-11-01), Kemper
Chang Chun
Huang Mine-Yuan
Jackson Stephen W
Muncy Geissler Olds & Lowe, PLLC
Princeton Technology Corporation
Thomas Lucy
LandOfFree
Electrostatic discharge prevention circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Electrostatic discharge prevention circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrostatic discharge prevention circuits will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2688165