Electrostatic discharge (ESD) protection structure

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – Device protection

Reexamination Certificate

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Details

C257S355000

Reexamination Certificate

active

07067852

ABSTRACT:
An ESD protection structure includes a semiconductor substrate of a first conductivity type, and first and second well regions of a second conductivity type disposed in the substrate. The first and second well regions are separated by a gap region of the substrate. Also included are first and second floating regions (of the second conductivity type) disposed in the first and second well regions adjacent to the gap region, respectively. The ESD protection structure also includes first and second contact regions of the first conductivity type disposed on the first and second well regions, respectively, and spaced apart from the first and second floating regions, respectively. The ESD protection structure also includes first and second contact regions of the second conductivity type disposed on the first and second well regions, respectively, and spaced apart from the first and second floating regions, respectively.

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patent: 5640299 (1997-06-01), Leach
patent: 5844280 (1998-12-01), Kim
patent: 5986863 (1999-11-01), Oh
patent: 5994741 (1999-11-01), Koizumi et al.
patent: 6011681 (2000-01-01), Ker et al.
patent: 6538266 (2003-03-01), Lee et al.
patent: 6891206 (2005-05-01), Czech et al.
patent: 2-28348 (1990-01-01), None

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