Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1975-08-13
1977-11-15
Gwinnell, Harry J.
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
96 1LY, 118644, G03G 1310
Patent
active
040586375
ABSTRACT:
Method is disclosed for developing electrostatic latent images, utilizing a developer supply unit formed of a liquid repellent layer having a thickness in the range of 3.mu. to 400.mu. (preferably 5.mu. to 330.mu.), and a substrate, and having uniformly distributed pores disposed therethrough. A liquid developer is supplied to the back surface of this unit, and an exposing unit is disposed to form electrostatic latent images onto the front surface of the developer supply unit. As a result, the liquid developer applied to the back surface of the liquid repellent layer is distributed on the front surface by the action of the electric field established by the latent image.
REFERENCES:
patent: 3096198 (1963-07-01), Schaffert
patent: 3220833 (1965-11-01), McFarlane
patent: 3472676 (1969-10-01), Cassiers et al.
patent: 3486922 (1969-12-01), Cassiers et al.
patent: 3561358 (1971-02-01), Weigl
patent: 3727758 (1973-04-01), Saito et al.
patent: 3743408 (1973-07-01), Ohno
patent: 3801315 (1974-04-01), Gundlach et al.
patent: 3894512 (1975-07-01), Ohno
Frenkel Stuart D.
Gwinnell Harry J.
Research and Development Laboratories of Ohno Co., Ltd.
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