Electrostatic charge measurement method, focus adjustment...

Radiant energy – Electron energy analysis

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S310000, C250S311000, C850S010000, C850S011000, C850S062000

Reexamination Certificate

active

07745782

ABSTRACT:
A method and a device are disclosed for suppressing error in electrostatic charge amount or defocus on the basis of electrostatic charge storage due to electron beam scanning when measuring the electrostatic charge amount of the sample or a focus adjustment amount by scanning the electron beam. An electrostatic charge measurement method, a focus adjustment method, or a scanning electron microscope for measuring an electrostatic charge amount or controlling an application voltage to the sample changes the application voltage to the energy filter while moving the scanning location of the electron beam on the sample.

REFERENCES:
patent: 4983830 (1991-01-01), Iwasaki
patent: 6038018 (2000-03-01), Yamazaki et al.
patent: 6521891 (2003-02-01), Dotan et al.
patent: 6847038 (2005-01-01), Todokoro et al.
patent: 6853941 (2005-02-01), Wang et al.
patent: 6946656 (2005-09-01), Ezumi et al.
patent: 7049591 (2006-05-01), Todokoro et al.
patent: 7087899 (2006-08-01), Ezumi et al.
patent: 7372028 (2008-05-01), Ezumi et al.
patent: 7655906 (2010-02-01), Cheng et al.
patent: 2003/0016153 (2003-01-01), Wang et al.
patent: 2004/0051041 (2004-03-01), Todokoro et al.
patent: 2004/0211899 (2004-10-01), Ezumi et al.
patent: 2005/0133719 (2005-06-01), Todokoro et al.
patent: 2005/0161600 (2005-07-01), Ezumi et al.
patent: 2006/0219918 (2006-10-01), Ezumi et al.
patent: 2007/0040118 (2007-02-01), Cheng et al.
patent: 2007/0221845 (2007-09-01), Komuro et al.
patent: 2008/0201091 (2008-08-01), Ezumi et al.
patent: 2008/0203298 (2008-08-01), Ishijima et al.
patent: 2009/0057557 (2009-03-01), Cheng et al.
patent: 4-229541 (1992-08-01), None
patent: 2001-52642 (2001-02-01), None
patent: 2001-236915 (2001-08-01), None
patent: 2006-19301 (2006-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Electrostatic charge measurement method, focus adjustment... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electrostatic charge measurement method, focus adjustment..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electrostatic charge measurement method, focus adjustment... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4248148

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.