Radiation imagery chemistry: process – composition – or product th – Electric or magnetic imagery – e.g. – xerography,... – Process of making radiation-sensitive product
Reexamination Certificate
2006-07-18
2006-07-18
Dote, Janis L. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Electric or magnetic imagery, e.g., xerography,...
Process of making radiation-sensitive product
C430S069000, C430S133000
Reexamination Certificate
active
07078143
ABSTRACT:
The object of the invention is to prevent interference fringes of images and allow precise measurement of the thickness of a layer by the optical interferometry by limiting the surface roughness of a conductive substrate. The surface roughness of the conductive substrate provided in an electrophotographic photoreceptor is such that the maximum peak-to-valley roughness height (Ry)=0.8 to 1.4 μm, the centerline average roughness (Ra)=0.10 to 0.15 μm, the ten-point average roughness (Rz)=0.7 to 1.3 μm, the average peak-to-peak distance (Sm)=5 to 30 μm, and the peak count Pc=60 to 100. In such an electrophotographic photoreceptor, light for exposure can be scattered to an appropriate extent, so that interference fringes can be prevented, and an interference pattern is formed during measurement of the thickness of the photosensitive layer by the optical interferometry so that the thickness of the layer can be measured with a high precision.
REFERENCES:
patent: 6239824 (2001-05-01), Mutou et al.
patent: 02-103556 (1990-04-01), None
patent: 4-336540 (1992-11-01), None
patent: 2000-356859 (2000-12-01), None
patent: 2001-027815 (2001-01-01), None
Japanese Patent Office machine-assisted English language translation of JP2001-027815 (Pub. Jan. 2001).
USPTO English-language translation of JP 02-103556 (pub. Apr. 1990).
Hashimoto Masaki
Kakui Mikio
Morita Kazushige
Sakamoto Masayuki
Tanaka Yuji
Dote Janis L.
Sharp Kabushiki Kaisha
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