Optics: measuring and testing – Refraction testing – Prism engaging specimen
Patent
1977-05-24
1978-09-26
Corbin, John K.
Optics: measuring and testing
Refraction testing
Prism engaging specimen
346 13, 346 33A, 356203, G01N 2726
Patent
active
041165659
ABSTRACT:
An analyzer for electrophoretic samples has a sample stage movable linearly with respect to a source and a detector of analysis energy. During a first scan of the sample, a voltage is produced representing either the minimum detected fluorescence or the minimum detected optical density. During a second scan, the voltage is combined with the output of the detector to automatically correct the output to a reference.
REFERENCES:
patent: 3479265 (1969-11-01), Elevitch
patent: 3623812 (1971-11-01), Hannig et al.
patent: 3635808 (1972-06-01), Elevitch
patent: 3706877 (1972-12-01), Clifford, Jr. et al.
patent: 3750187 (1973-07-01), Keefer
patent: 3902813 (1975-09-01), VandenBroek et al.
Gelman Instrument Company, "ACD-15 Automatic Computing Densitometer," (Product Brochure).
Magner Richard G.
Powell William E.
Corbin John K.
Corning Glass Works
Koren Matthew W.
Kurtz Richard E.
Patty, Jr. Clarence R.
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