Electrophoretic analyzer with automatic reference circuit

Optics: measuring and testing – Refraction testing – Prism engaging specimen

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346 13, 346 33A, 356203, G01N 2726

Patent

active

041165659

ABSTRACT:
An analyzer for electrophoretic samples has a sample stage movable linearly with respect to a source and a detector of analysis energy. During a first scan of the sample, a voltage is produced representing either the minimum detected fluorescence or the minimum detected optical density. During a second scan, the voltage is combined with the output of the detector to automatically correct the output to a reference.

REFERENCES:
patent: 3479265 (1969-11-01), Elevitch
patent: 3623812 (1971-11-01), Hannig et al.
patent: 3635808 (1972-06-01), Elevitch
patent: 3706877 (1972-12-01), Clifford, Jr. et al.
patent: 3750187 (1973-07-01), Keefer
patent: 3902813 (1975-09-01), VandenBroek et al.
Gelman Instrument Company, "ACD-15 Automatic Computing Densitometer," (Product Brochure).

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