Optics: measuring and testing – By electrophoresis
Patent
1989-03-29
1991-10-29
Niebling, John F.
Optics: measuring and testing
By electrophoresis
204299R, 2041828, G01N 2100, B01D 6142, C25D 1300
Patent
active
050610678
ABSTRACT:
An electrophoresis pattern analyzer for genetic material of this invention comprises: an image data generating means for optically reading an electrophoresis specimen and outputting datum image data corresponding to a datum region and sample image data corresponding to at least one sample region; a datum band pattern retrieving means for retrieving datum band patterns concerning position coordinates of the bands of the datum region in the direction of electrophoresis and two-dimensional forms of the bands of the datum region from the datum image data; a sample band pattern retrieving means for retrieving sample band patterns concerning position coordinates of the bands of the sample region in the direction of electrophoresis and two-dimensional forms of the bands of the sample region from the sample image data; and a band pattern comparing means for comparing the datum band patterns with the sample band patterns and determining characteristics of the sample region. The electrophoresis pattern analyzer for genetic material of this invention provides advantages of more precise, less expensive and higher speed analysis and identification than the conventional visual analysis and identification.
REFERENCES:
patent: 3783117 (1974-01-01), Bean
patent: 4429996 (1984-02-01), Kamachi
patent: 4832815 (1989-05-01), Kambara
Momiyama Masayoshi
Nakagawa Masakazu
Yamamoto Takekazu
Aisin Seiki Kabushiki Kaisha
Koestner Caroline
Niebling John F.
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