Electrooptic voltage waveform measuring method and apparatus

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Using radiant energy

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324753, G01R 31308

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active

060576774

ABSTRACT:
An electrooptic voltage waveform measuring apparatus, which includes an electrooptic element having an electrooptic effect; a first electrode mounted on the electrooptic element and electrically coupled to an object to be measured; and a first light source irradiating a light on the electrooptic element. The electrooptic voltage waveform measuring apparatus further includes a polarization analyzer for analyzing a polarization state of the light passed through the electrooptic element and detecting a voltage waveform of the object; a second electrode mounted on the electrooptic element and separated from the first electrode; and an amplifier having an input terminal coupled to the second electrode and outputting a low-frequency component of the voltage waveform of the object. The electrooptic voltage waveform measuring apparatus further includes a voltage waveform combining processor obtaining a measured voltage waveform of the object by combining a high-frequency component of the voltage waveform of the object obtained from an output of the polarization analyzer and the low-frequency component of the voltage waveform of the object output from the amplifier.

REFERENCES:
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patent: 5677635 (1997-10-01), Fujii et al.
patent: 5767688 (1998-06-01), Takahashi et al.
Janis A. Valdmanis et al.; IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, pp. 69-78, Jan. 1986.

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