Electrooptic measurement systems for frequency analysis of very

Details Electrooptic measurement systems for frequency analysis of very Electrooptic measurement systems for frequency analysis of very

1989-07-17

1991-08-20

Williams, Hezron E.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Analysis of complex waves

G01R 2316

Patent

active

050417789

ABSTRACT:
A spectrum analyzer for a variable amplitude and frequency electric signal includes an optical modulator responsive to the signal that derives a first optical wave having intensity and frequency components corresponding to the signal amplitude and frequency components. An optical analyzer responds to the first optical wave to derive a second optical wave having intensity variations at frequency components corresponding to the amplitude of the electric signal at the frequencies in the spectrum of the signal. The optical analyzer includes a tunable optical cavity responsive to the first optical wave to derive the second optical wave.

REFERENCES:
patent: 4417815 (1983-11-01), Murray et al.
patent: 4465969 (1984-08-01), Tada et al.
patent: 4618819 (1986-10-01), Mourou et al.
patent: 4891580 (1990-01-01), Valdmanis
Janis A. Valdmanis et al, "Subpicosecond Electrooptic Sampling: Principles and Applications", IEEE Journal of Quantum Electronics, vol. QE-22, No. 1, Jan. 1986, pp. 69-78.

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