Electrooptic device, electronic apparatus, and method for...

Details Electrooptic device, electronic apparatus, and method for... Electrooptic device, electronic apparatus, and method for...

2007-06-19

2007-06-19

Lebentritt, Michael (Department: 2812)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S701000, C359S245000, C372S012000

Reexamination Certificate

active

10979144

ABSTRACT:
The invention provides an electrooptic device and an electronic apparatus, in which the electrical characteristics of many thin-film switching elements formed in a substrate to support an electrooptic material can be accurately inspected. The invention also provides a method for making the electrooptic device. In a TFT array substrate of a liquid crystal device, an inspection TFT is formed in one of dummy pixels disposed at the periphery of a pixel region. A pixel electrode connected to a drain region of the TFT functions as a first inspection pad. In an adjacent dummy pixel, the pixel electrode electrically connected to an extended portion of a data line functions as a second inspection pad. In another adjacent dummy pixel, the pixel electrode electrically connected to an extended portion of a scan line via a junction electrode functions as a third inspection pad.

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