Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-03-08
2011-03-08
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S762050
Reexamination Certificate
active
07902846
ABSTRACT:
The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.
REFERENCES:
patent: 5517126 (1996-05-01), Yamaguchi
patent: 6005401 (1999-12-01), Nakata et al.
patent: 6084419 (2000-07-01), Sato et al.
patent: 6094059 (2000-07-01), Frankeny et al.
patent: 2002/0003432 (2002-01-01), Leas et al.
patent: 2006/0186904 (2006-08-01), Natsuhara et al.
patent: 2007/0001790 (2007-01-01), Richmond et al.
Calderon Alberto
Deboe Kenneth W.
Lindsey Scott E.
Richmond, II Donald P.
Steps Steven C.
Aehr Test Systems
De Klerk Stephen M.
Nguyen Ha Tran T
SNR Denton US LLP
Vazquez Arleen M
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