Electronic test system and method

Details Electronic test system and method Electronic test system and method

2005-01-04

2005-01-04

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Including program set up

Reexamination Certificate

active

06839650

ABSTRACT:
An electronic test system having an object oriented hierarchical infrastructure including classes that allow a test developer or a test user to design a desired electronic test system. The class relationships define the function of the electronic test system. Classes include a procedure class, a test class, a measurement class, a datapoint class, a parameter class, a DUT class, a test system class, a specification class, a run procedure class, a result class, a plug-in class, an exec class, a model class, a device class, a test system device class, a user menu item class, an application class, and a state class. These classes are implemented in a hierarchical structure in which a datapoint is a subset of a measurement, a measurement is a configuration for a test, a test is a group of measurements that share the same test algorithm, and a procedure is an ordered list of tests to be run, and includes a list of measurements and datapoints.

REFERENCES:
patent: 5206582 (1993-04-01), Ekstedt et al.
patent: 6094733 (2000-07-01), Momohara
patent: 6128759 (2000-10-01), Hansen
patent: 6349392 (2002-02-01), Swoboda et al.
patent: 6360332 (2002-03-01), Weinberg et al.
patent: 6449744 (2002-09-01), Hansen
patent: 20030078679 (2003-04-01), Sutton
patent: 20030093736 (2003-05-01), Grey
patent: 1 308 737 (2003-05-01), None
patent: WO 9947937 (1999-09-01), None
XP002259312, Klinger, Motti, “Reusable Test Executive and Test Programs Methodology and Implementation Comparison Between HP Vee and Labview”, Proceedings of the Autotestcon 1999, IEEE, Aug. 30, 1999-Sep. 2, 1999, pp. 305-312, p. 307, col. 1, paragraph1-col. 2, last paragraph; p. 305, col. 1, paragraph 2-p. 306, col. 2, last paragraph.
Thompson, Kirk D., “COM-Based Test Foundation Framework”, Autotestcon '99, IEEE Systems Readiness Technology Conference, 1999, IEEE San Antonio, TX, USA Aug. 30-Sep. 2, 1999, Piscataway, NJ, USA, IEEE, US, Aug. 30, 1999, pp. 19-25, XP010356126, ISBN: 0-7803-5432-X; Figures 1, 2; p. 19, col. 2, paragraph 2—p. 21, col. 1, paragraph 1; p. 22, col. 1, paragraph 1-col. 2, paragraph 2.
Fertitta, K. G. et al, “The Role of Activex and COM in ATE”, Autotestcon '99. IEEE Systems Readiness Technology Conference, 1999, IEEE San Antonion, TX, USA Aug. 30-Sep. 2, 1999, Piscataway, NJ, USA, IEEE, US, Aug. 30, 1999, pp. 35-51, XP010356128, ISBN: 0-7803-5432-X, p. 35, col. 2, paragraph 4-p. 40, col. 2, paragraph 8.
National Instruments, “TestStand—A Complete Test Executive Environment,” National Instruments, pp. 55-60 (Mar., 2000).

Affiliated with

Also associated with

Rating

Electronic test system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electronic test system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electronic test system and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3424974