Electronic test probe interface assembly and method of manufactu

Details Electronic test probe interface assembly and method of manufactu Electronic test probe interface assembly and method of manufactu

1999-01-06

2000-10-24

Karlsen, Ernest

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

29825, 324757, G01R 1073, H01R 4300

Patent

active

061372978

ABSTRACT:
An interface module for testing integrated circuits and a method of manufacture are disclosed wherein a planar self supporting diaphragm supports signal paths connected to a pattern of probe contacts extending therefrom which are in registration with a pattern of integrated circuit access pads. The diaphragm is resiliently connected to a planar printed circuit board in a plane substantially parallel to the plane of the printed circuit board. A floppy substrate is placed between the printed circuit board and the diaphragm to provide signal paths from the printed circuit board to the self supporting diaphragm.
The method includes laser location and drilling of holes to obtain a high density of accurately positioned small diameter holes in the self supporting diaphragm material to thereby accomplish high probe contact density in unlimited pattern arrays.

REFERENCES:
patent: 3654585 (1972-04-01), Wickersham
patent: 4899099 (1990-02-01), Mendenhall et al.
patent: 4932883 (1990-06-01), Hsia et al.
patent: 5172050 (1992-12-01), Swapp
patent: 5225037 (1993-07-01), Elder et al.
patent: 5475317 (1995-12-01), Smith
patent: 5604446 (1997-02-01), Sano
patent: 5625298 (1997-04-01), Hirano et al.
patent: 5742174 (1998-04-01), Kister et al.
patent: 5829126 (1998-11-01), Nagao et al.

Affiliated with

Also associated with

Rating

Electronic test probe interface assembly and method of manufactu does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Electronic test probe interface assembly and method of manufactu, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Electronic test probe interface assembly and method of manufactu will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1967807