Electronic test circuit for an integrated circuit and...

Details Electronic test circuit for an integrated circuit and... Electronic test circuit for an integrated circuit and...

2007-01-12

2008-12-30

Williams, Howard (Department: 2819)

Coded data generation or conversion

Converter calibration or testing

C375S225000

Reexamination Certificate

active

07471220

ABSTRACT:
The electronic test circuit for an integrated circuit to be tested has an input for receiving an analog data stream (23), a programmable digital line emulator (TPE1) for emulating properties of a transmission path and an output for emitting an analog data stream (24) having a signal-to-noise ratio which can be adjusted using the programmable digital line emulator (TPE1).

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