Electronic systems testing employing embedded serial scan...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

06920416

ABSTRACT:
An electronic system includes electronic circuitry to be tested having serial scan shift register latches, and a serial scan generator embedded in the electronic system upon manufacture and connected to the serial scan shift register latches of the electronic circuitry to facilitate testing. The electronic system may consist of a single printed circuit board mounting both the electronic circuitry and the serial scan generator. The electronic system may consist of a single semiconductor chip carrier mounting both the electronic circuitry and the serial scan generator, are both mounted on said single semiconductor chip carrier. The electronic system may further include a detachable second serial scan generator. The serial scan generator preferably operates slower than the detachable second serial scan generator. The electronic system may further include a disabling terminal disabling the serial scan generator upon attachment of the detachable second serial scan generator.

REFERENCES:
patent: 3824462 (1974-07-01), Vinsani
patent: 4945536 (1990-07-01), Hancu

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