Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate
1996-04-01
2001-10-23
Tran, Minh Loan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
C257S379000, C257S528000
Reexamination Certificate
active
06307250
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention generally relates high speed integrated circuit (IC) chips which experience large changes in current as circuits switch and, more particularly, to the addition of decoupling capacitors to limit &Dgr;I noise without the attendant reduction in chip yield normally encountered with the addition of such decoupling capacitors.
2. Background Description
In high performance chips where there are large changes in current as circuits switch, it has become necessary to add capacitance between the power supply and ground leads to limit &Dgr;I noise. This capacitance can be formed from normal device thin oxide. However, any defects in this added thin oxide can result in high leakage currents or shorts due to defective capacitors, lowering chip yield and greatly increasing the cost of production of high performance chips.
SUMMARY OF THE INVENTION
It is therefore an object of the present invention to provide decoupling capacitors for high performance IC chips to limit &Dgr;I noise without the attendant reduction in chip yield normally encountered with the addition of such decoupling capacitors.
According to the invention, there is provided an electronic switch consisting of a device in series with a capacitor so that only good capacitors are connected. The bad capacitors are switched out automatically by means of feedback at each capacitor. The circuit comprises a control device that operates in the subthreshold or off device state to detect leakage in a decoupling capacitor. This control device operates in a low impedance state if the capacitor is good and in a high impedance sate if the capacitor is bad. A feedback circuit is connected from an internal node of the capacitor to a gate of the control device so that once a state of the capacitor is detected it can be stored on the gate of the control device. A single external signal source shared by a group of capacitors activates the control device to detect leakage in the capacitor. The circuit operates to switch out capacitors that fail during normal operation.
REFERENCES:
patent: 4791316 (1988-12-01), Winnerl et al.
patent: 5506457 (1996-04-01), Krauter et al.
patent: 63-156318 (1988-06-01), None
Krauter Byron L.
Lam Chung H.
Miller Linda A.
Mittl Steven W.
Sechler Robert F.
International Business Machines - Corporation
Tran Minh Loan
Walter, Jr. Howard J.
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